Copper-related defects in ZnTe thin films grown by the close space sublimation method

DOI: https://doi.org/10.53081/mjps.2022.21-1.03

Authors:

Ion Lungu; Lidia Ghimpu; Dumitru Untila; Tamara Potlog

Summary:

Low-temperature photoluminescence (PL) is used to study defects evolution via immersion technique and annealing in vacuum of ZnTe thin films. In this paper we studied how copper doping from solutions of different molar concentrations affects PL of ZnTe thin films grown by close space sublimation (CSS) method. Undoped ZnTe thin films showed PL emission in the (520-680) nm wavelength region. The incorporation of copper in ZnTe produce a number of broad emission bands that correspond to an electron transition from the conduction band to spin-orbit states of the localized level of Cu2+ ions. All the studied samples had variable concentrations of oxygen and the possibility of the formation of auxiliary oxides is discussed.

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